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news
about us
open jobs
1
team
visitors
alumni
contact
research
publications
research lines
nanoSeminars
events
projects
presentations
equipment
academics
our courses
choose your thesis
third mission
patents
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Combined AFM-STM microscopy at very low temperature: a tool for accessing local electronic properties in nanocircuits
Philippe Joyez
CEA-Saclay
May 25, 2007, 1:15 p.m.
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Combined AFM-STM microscopy at very low temperature: a tool for accessing local electronic properties in nanocircuits
Philippe Joyez
CEA-Saclay
May 25, 2007, 1:15 p.m.
Add event to calendar
Add event to calendar
Share
